the 43rd international conference and exhibition on
24-28 July
Anaheim, California
Introducing an efficient and general method for rendering specular-surface microstructure. The method treats a specular surface as a four-dimensional position-normal distribution, and fits this distribution using a mixture of 4D Gaussian flakes. This leads to fast closed-form solutions to the required BRDF evaluation and sampling queries.
Ling-Qi Yan
University of California, Berkeley
Milos Hasan
Autodesk, Inc.
Steve Marschner
Cornell University
Ravi Ramamoorthi
University of California, San Diego
This paper introduces a multi-scale SV-BRDF model for scratched materials such as metals, plastics, or finished woods. The method controls the profile, micro-BRDF, density, and orientation of scratches; takes into account all inter-reflections inside a scratch; and works in direct and global illumination settings.
Boris Raymond
Université de Bordeaux
Gael Guennebaud
INRIA
Pascal Barla
INRIA
Modeling multiple scattering in microfacet theory is considered an important open problem. This work derives the missing multiple-scattering components of the popular family of BSDFs based on the Smith microsurface model.
Eric Heitz
Unity Technologies
Johannes Hanika
Karlsruher Institut für Technologie
Eugene d'Eon
8i
Carsten Dachsbacher
Karlsruher Institut für Technologie
The highly anisotropic appearance of metals is predicted from micron-scale measurements of surface geometry. In this work, geometric and wave-optics approaches are tested, a new ellipsoid NDF is proposed, and spatial texture is explored.
Zhao Dong
Autodesk, Inc.
Bruce Walter
Cornell University
Steve Marschner
Cornell University
Donald Greenberg
Cornell University